About Aphesa
Aphesa provides consulting in image sensors, image sensor characterization, image sensor integration and machine vision integration services as well as image sensor and technology training sessions.
Aphesa also develops custom and standard industrial cameras for line scan and area scan sensors based on the CameraLink, GigE-Vision, USB3-Vision, USB2 and USB3 protocols. We apply and follow the recommendations of the international machine vision standards.
We have developed an EMVA1288 v3 compliant test equipment to characterize and benchmark image sensors and cameras for industrial, medical, automotive, space, scientific and other machine vision applications.
We also provide custom software and hardware development services.
Our team is made of four full time engineers and multiple freelance engineers with long experience in electronics development and imaging as well as several other support and development personnel.
Our rates start as low as 480€ per day.
The company is located in Belgium and has been founded in 2008 by Arnaud Darmont.
Featured service
With the EMVA1288 measurement service you can have your cameras tested on our EMVA1288 test bench. A PDF report with all calculation results and all graphs is provided.
Featured product
We have developed an EMVA1288 v3 compliant test equipment to characterize and benchmark image sensors and cameras for industrial and machine vision applications. The system is off the shelve available and includes many options for various type of standard lens mounts and standard electrical interfaces.
News
October 2016 - Aphesa organises another Imaging Technology course in San Francisco in January. Registration is open.
July 2016 - The next Imaging Technology Training session will be organized in November in Stuttgart after the Vision Show. Registration is open.
May 2016 - Aphesa will be exhibiting at Vision 2016 at 1B80.
Mar 2016 - Aphesa will give a talk about High Dynamic Range Imaging et the 62nd Heidelberg Image Processing forum in July
Fev 2016 - Aphesa chairs the Image Sensor conference at Electronic Imaging
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