Publications and blog
Image sensors technology publications
|Spectral Response of Silicon Sensors|
White paper describing the physical properties of silicon and how silicon can see. Large emphasis is made on spectral response first and second order effects.
Download (53213 downloads)
|From CCDinosaurs to the APS century|
Invited Keynote at the 2016 Caeleste workshop in Brussels (part of SPIE Photonics Europe) - about the history of imaging from CCD to CMOS APS devices and a window on the future
Download (1578 downloads)
|Using the EMVA1288 standard to select an image sensor or camera|
Using the EMVA1288 standard to select an image sensor or camera (Paper presented at SPIE Electronic Imaging 2010, see first page of the document for an abstract)
Download (5576 downloads)
|Implementing and using the EMVA1288 standard|
We have measured cameras of various kinds on our test equipment. The test system design and all the measurement sets require to go in the details of the standard and also show us how good it can be but also how difficult it can be.
The purpose of this paper is to give feedback on the standard, based on our experience of implementers and users. We will see that some measurements are easily reproducible and can easily be implemented while others require more research on hardware, software and procedures and also that the results can sometimes have very little meaning. Our conclusion will be that the EMVA1288 standard is good and well suited for the measurement and characterization of image sensors and cameras for image processing applications but that it is hard for a newcomer to understand the produced data and properly use a test equipment.
Download (4746 downloads)
|Why using variable exposure time in EMVA1288 measurements|
Why using variable exposure time instead of variable light intensity in EMVA1288 measurements
View (700 views)
|Why using average instead of variance in EMVA1288 dark current measurement|
The EMVA1288 standard proposes two methods for dark current measurement. The first method uses the average variation of dark images when exposure time is increased, while the other uses the variation of the variance of the dark images. Why can they give different results?
View (613 views)
|How to ensure that your EMVA1288 equipment is compliant|
EMVA1288 is currently self-certifying. How can you do this?
Certification procedures will change in version 3.2 and 3.3 of the standard, what do you have to expect?
View (190 views)
Camera design publications
|How to extend the operating temperature of FPGAs|
Our high temperature camera for oil and gas wells inspection requires to operate at very high temperatures above the specified operating junction temperature of the FPGAs and with limited cooling possibilities. This article published in the Xilinx XCell journal explains how we have achieved this.
Download (716 downloads)
During our preliminary project meetings with customers, we are usually asked about the general architecture of a camera, so let's explain this in a short blog post.
View (148 views)
|Why do you need a specialized partner to develop a custom camera|
Many companies have electronic development capabilities and because today's CMOS image sensors are fully digital and easy to use, many of them attempt to develop their own cameras. Even if it is indeed a lot easier today to develop a camera based on a CMOS device than it used to be during the CCD era, there are plenty of pitfalls that explain why cameras are still developed by specialized companies.
View (775 views)
|Vision Award 2014 press release|
Press release in Industrial Machine Vision Europe (IMVE) about the short listing of Aphesa for the 2014 Vision Award
Download (1314 downloads)
|Why technical training is important|
Why is is so important to technically train your personnel?
View (673 views)